Validating samples is a time consuming and expensive process when trying to track down defects and reasons for semiconductor failures. Optical microscopes were used to examine samples after each ...

Scanning electron microscopy (SEM) is an advanced analytical tool that massively outstrips the capabilities of traditional light microscopy. Using visible wavelengths of light on the 400 – 700 ...

It’s a problem that few of us will ever face, but if you ever have to calibrate your scanning electron microscope, you’ll need a resolution target with a high contrast under an electron beam. This ...

The history of the electron microscope dates back to early twentieth century when the first electromagnetic lens was developed. This opened the door of possibility to use the principles of the lens to ...

Reflection-contrast microscopy is a type of light microscopy that can be used to analyze single cells, biopsies, and other small objects. In contrary to most light microscopy techniques, ...