To make a remote temperature sensor with the LTC2970, run two different currents (ILOW and IHIGH) through the transistor and measure VBE at both currents (VBE_LOW and VBE_HIGH). The difference between ...
In a PVEL survey of 2018, light-induced degradation (LID, LeTID) was identified as the defect that causes the greatest concern among investors implying severe financial risks [1]. One reason is that ...
Accurately estimating the junction temperature of a semiconductor device is essential for ensuring its reliability, performance, and longevity. Junction temperature has a direct influence on the ...
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