Nanowerk

Imaging ellipsometry for process control of MXene-based capacitive devices

Imaging ellipsometry enables non-destructive, multi-scale quality control of microstructured MXene thin films during device ...

Imaging ellipsometry tracks MXene thin-film quality during fabrication without damage

A German–Israeli research team led by Dr. Andreas Furchner has demonstrated how imaging ellipsometry enables non-destructive characterization and quality control of microstructured MXene thin films ...

AI makes a major breakthrough in a math problem that had stumped experts for decades

For nearly 80 years, mathematicians have struggled to solve a classic geometry puzzle first posed by Paul Erdős in 1946: the ...
C&EN

Real-Time Ellipsometry at High and Low Temperatures

Institute for Technical Physics and Materials Science, Centre for Energy Research, Budapest 1525, Hungary Department of Electrical and Electronic Engineering, Institute of Physics, Faculty of Science ...
IEEE

Characterization of Dielectric Properties of Metal Films in Terahertz Frequency Range

Abstract: Dielectric constants of materials are a key parameter for device design. We report on the results of terahertz time-domain ellipsometry (THz-TDE) for thick and thin metal films and found ...
IEEE

Developments in THz-Range Ellipsometry: Quasi-Optical Ellipsometer

Abstract: A novel experimental setup for multiangular ellipsometric measurements in terahertz spectral range 0.1- 1 THz is described. The instrument operates in polarizer-compensator-sample-analyzer ...