A German–Israeli research team led by Dr. Andreas Furchner has demonstrated how imaging ellipsometry enables non-destructive characterization and quality control of microstructured MXene thin films ...
Imaging ellipsometry enables non-destructive, multi-scale quality control of microstructured MXene thin films during device ...
A new chip-making technique exploits a material's crystal structure to create nanoscale patterns at room temperature directly onto hard materials used in devices, including silica. The method could ...
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